Product lineup
Semiconductor Metrology Equipment
- Advanced Film Thickness Probe
- Reflectometer for materials analysis
- Laser ellipsometer for ultimate precision
- Spectroscopic ellipsometer for largest spectral range Photovoltaics
- Laser ellipsometer and reflectometer for the measurement of antireflective coatings on silicon solar cells
- Spectroscopic ellipsometer for the analysis of TCO films (SnO2, AZO, ITO)
- Spectroscopic ellipsometers and reflectometers for the analysis of absorber films (a-Si, ยต-Si, CdTe, CdS, CIS, CIGSE)
Overview of SENTECH Instruments GmbH
SENTECH Instruments GmbH Germany
SENTECH Instruments GmbH develops, manufactures and sells advanced quality instrumentation for Thin Film Metrology
Inquiry on the products
Reception hours: Weekdays 9:00-17:30
(excluding Saturdays, Sundays, holidays, and company-designated holidays)