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2013/01/22

Exhibition Information of SURTECH 2013


30th(Wed) Jan.~1st (FRI) Feb. 2012

Tokyo Bigsite East 6hole
Booth no. : 6G-06


1. Hitachi High-Tech Science Corporation (Japan)
・Scanning probe microscope (DEMO)
・FIB/SEM

2. Leica Microsystems (Germany)
・Inspection & Review System - Leica DM8000M (DEMO)

3. Applied Spectra Inc.(U.S.A.)
・Laser Ablation system

4. GBC scientific equipment Pty Ltd. (Australia)
・ICP-TOF-MASS