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01/10/2007

Exhibition Information of The nearest exhibition (ELECTROTEST JAPAN and LASER & OPTICS)

■24th ELECTROTEST JAPAN
Place: Tokyo Big Sight
Date: 1/17-1/19
On Display:
【ELECTRONIC EQUIPMENT 1ST DIV. [Co-Exhibitor: I-BIT CO., LTD.]】Booth No: 6-3
・ThermoStream System of TEMPTRONIC CORPORATION
High-speed-temperature-transition-system for thermal test
・X-ray inspection system of I-Bit CO., LTD
Compact and high-resolution system

【ELECTRONIC EQUIPMENT 2ND DIV. [Co-Exhibitor: MIRTEC CO., LTD.]】
Booth No:1-18
・AOI (Desktop Type) of MIRTEC Co., Ltd.
High Performance DeskTop Model
・Non-Vibration and In-Line AOI System of MIRTEC Co., Ltd.
Non-Vibration and In-Line AOI System
・In-Line AOI System of MIRTEC Co., Ltd.
Standard In-Line AOI System

URL: http://www.electrotest.jp/english/

■LASER & OPTICS 2007
Place: Tokyo Big Sight Booth No: 31-29
Date: 1/17-1/19
On Display:
・Laser Beam Analyzer, M2 Beam Propagation Analyzer and High power laser profiler of Spiricon, Inc.
wavelength: 190nm-1000nm, It is able to profiling the
laser beam (CO2) for a maximum output of 8kw
・Miniature Spectrometer of Ocean Optics, Inc
Wavelength window: 200-1100nm, Optical resolution:
0.3-20nm (FWHM), Incorporable miniature spectrometer
into your system
・Beam Shapers of Newport Corporation
Highly converts Gaussian beam input to flat top output

URL: http://www.nepcon.jp/english/lo/